Singh Center Logo



Our research utilizes the Nanoscale Characterization Facility at the Singh Center for Nanotechnology at the University of Pennsylvania.

We are thankful for the support of these facilities by the National Nanotechnology Coordinated Infrastructure (NNCI) network, which is supported by the National Science Foundation (Grant NNCI-1542153) and the Laboratory for Research on the Structure of Matter, the University of Pennsylvania Materials Research Science and Engineering Center (MRSEC) (DMR-1720530).

The scanning / transmission electron microscopes at the Singh Center for Nanotechnology are also the North American Demo site for the JEOL USA Corporation.  We are thankful for their cooperation and collaboration.

We also thank the support of Dr. Douglas Yates and Dr. Jamie Ford at the Singh Center.

JEOL NEOARM Aberration-corrected Scanning Transmission Electron Microscope

JEOL F200 Scanning  / Transmission Electron Microscope

The JEOL F200 is a 200kV scanning / transmission electron microscope with a cold field emission source, two large area energy dispersive x-ray spectrometers, and Gatan OneView IS camera for in situ/operando imaging at 30 frames per second. It incorporates STEMx capability.

This instrument is where we conduct many of our in-situ and operando experiments, as it is easy to switch between TEM, STEM, diffraction and spectroscopy modes.

TESCAN S8000X Focused Ion Beam / Scanning Electron Microscope

The TESCAN S8000X is a versatile instrument for the characterization of materials. It combines a plasma-source focused ion beam microscope and a high- resolution (BrightBeam) scanning electron microscope. The FIB microscope is equipped with a Xe+ ion plasma source and will include additional gases in the near future. The Xe plasma can generate a focused beam up to 1 uA, which allows very high milling rates (up to 50X faster than the pior Ga+ ion technology) and does not lead to deliterous ion implantation in the same way that Ga+ ions do. The BrightBeam SEM is a field-free, ultra-high resolution electron microscope whose optics allow improved resolution, even at low energies. This improves imaging of non-conducting samples. The instrument is equipped with advanced analytical capabilities, as well. These include a Time-of-Flight Secondary Ion Mass Spectrometery (ToF-SIMS) that can detect the ions emitted from the sample, allowing chemical characterization. ToF-SIMS is especially useful in detecting light elements, including the discrimination of hydrogen and deuterium. An Energy Dispersive x-ray spectrometer allows for additional, complementary chemical characterization. The S8000X is also equipped with a cryogenic stage and a sample transfer loadlock, allowing work down to -160 C or introduction of frozen samples into the tool to be milled. A cryogenic Kleindiek nanomanipulator enables users to interact with the sample in-situ as well as lift-out frozen sections for subsequent TEM analysis.

This instrument was purchased with support from a National Science Foundations’ Major Research Instrumentation grant (NSF MRI #1828545).  Additional support from the Laboratory for Research on the Structure of Matter (University of Pennsylvania Materials Research Science and Engineering Center (MRSEC) (DMR-1720530).